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Micro/Nano Technology Center

Home
About Us
- Administration and Staff
- Annual Reports
About UsAbout Us Dropdown Toggle
- Administration and Staff
- Annual Reports
Capabilities & Equipment
- Capabilities & Equipment
- Photolithography
- Wafer Thermal Processing
- Testing & Characterization
- Etching, Machining, & Bonding
- Packaging
- Electron Microscopy & Imaging
- Excess Equipment
- equipment
Capabilities & EquipmentCapabilities & Equipment Dropdown Toggle
- Capabilities & Equipment
- Photolithography
- Wafer Thermal Processing
- Testing & Characterization
- Etching, Machining, & Bonding
- Packaging
- Electron Microscopy & Imaging
- Excess Equipment
- equipment
How to Become a User
User Information
- How to Become a User
- FOM- Facility Online Manager
- Standard Operating Procedures (SOP's)
- Characterization Data
- Dicing Request
- Photomask Request
- Cleanroom Safety Guidelines
- SDS Database
- L-Edit design
- Photoresist Profiles for DRIE S1827 and AZ4620
- PEALD and ALD SOP
- TiW_Stress_Control_2.pdf
- GeSndeptestdata.xlsx
User InformationUser Information Dropdown Toggle
- How to Become a User
- FOM- Facility Online Manager
- Standard Operating Procedures (SOP's)
- Characterization Data
- Dicing Request
- Photomask Request
- Cleanroom Safety Guidelines
- SDS Database
- L-Edit design
- Photoresist Profiles for DRIE S1827 and AZ4620
- PEALD and ALD SOP
- TiW_Stress_Control_2.pdf
- GeSndeptestdata.xlsx
MNTC Rates
- MNTC Rates July 1, 2025
MNTC RatesMNTC Rates Dropdown Toggle
- MNTC Rates July 1, 2025
Pay My Bill
Contact Us
- Inquiry form
Contact UsContact Us Dropdown Toggle
- Inquiry form
Self - Guided Tour
ECE 544 Microfabrication/MEMS Laboratory
OASiS Certification
- SemiconductorRapidCertificationFlyer_2025.png
- SemiconductorRapidCertificationFlyer_2025_noQR.png
OASiS CertificationOASiS Certification Dropdown Toggle
- SemiconductorRapidCertificationFlyer_2025.png
- SemiconductorRapidCertificationFlyer_2025_noQR.png

Pic3

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