EM Core Equipment

  University of Louisville

  

Hitachi HT7700

  • Located at the University of Louisville MDR Building, Room 526
  • Dual-Mode objective lens

Imaging

  • 120 kV compact-digital Biological transmission electron microscope.
  • User-friendly electron microscope that can be used in a lighted room.
  • Fully digital, so samples can be scanned simply be viewing a computer screen. This is particularly important for viewing low contrast samples, and is convenient for training students.
  • Associated software allows user to track the regions of tissue that have been viewed
  • Includes an automated multi-frame function, which facilitates efficient and precise data collection.

Leica UC7 Ultramicrotome

  • Located at the University of Louisville MDR Building
  • Ultramicrotome for ultrathin sectioning of samples for EM.

Leica Ultramicrotome Features

  • Adjustable cutting window (0.3-15mm) and cutting speed (0.2-90mm/s wheel controlled)
  • 360° rotatable knife block
  • Knife holder for 6-12mm knives
  • Top/back light LED Illumination
  • Magnification: S4E: 10X-48X

Cutting Transmission: vibration decoupled gravity stroke

Coarse knife-movements: N-S: 10mm stepping motor
E-W: 25mm manual drive

Located at the University of Louisville

Thermo-Fisher Scientific Apreo C LoVac FESEM

Imaging

  • 2 nm ultra-high resolution
  • Back-scattered detector (BSD)
  • Scanning Transmission Electron Microscopy (STEM) Detector
  • Energy-dispersive X-ray spectroscopy (EDS) Detector



Located at the University of Louisville

Gold/Gold-Palladium Sputter Coater with Thickness monitor

Asylum MFP-3D-Original AFM

Asylum MFP-3D-BIO



  University of Kentucky

 

JEOL 2010F

  • Located at the University of Kentucky
  • Dual-Mode objective lens

Features

  • Field Emission Gun operating at 200 keV
  • Resolution: 0.19 nm point-to-point imaging
  • Specimen Stage: +- 12 degree tilt
  • JEOL single, double low background, and GATAN cryo double tilt holders available
  • Fischione HAADF detector for Z-contrast STEM
  • Oxford INCA EDX detector
  • EmiSpec EsVision
  • GATAN GIF 2000 EELS spectrometer
  • Ideal for:  EDS for elemental profiling and mapping, EELS for light element analysis and mapping, SAD for crystal phase structural analysis, high-angle annular dark field (HAADF) STEM for Z-contrast; useful for composite and catalyst research

FEI Helios Nanolab 660

  • Located at the University of Kentucky
  • Dual-Mode objective lens

Imaging

  • Field Emission Gun (Schottky emitter), with UC technology (monochromator)
  • Sub-nanometer resolution from 500 V to 30 kV
  • Beam deceleration capabilities (stage bias)
  • Specimen Stage: x, y 150 mm; z 10mm all piezo driven; tilt -10 to +60°
  • Six electron detectors for optimal imaging

Focused Ion Beam (FIB)

  • Gallium LMIS (Liquid Metal Ion Source) for precision milling, cross-sectioning, TEM sample preparation
  • Gas Injection System (GIS) for metal and insulator deposition
  • Slice milling and imaging steps automated for 3D SEM reconstruction

Characterization

  • Oxford EDX detector for elemental analysis
    Oxford EBSD detector for crystal orientation analysis
  • 3D EDX and EBSD capabilties

Ideal for: Ultra high resolution imaging, in-situ cross-sectioning and TEM sample preparation, automated surface pattern generation (milling or deposition), 3D SEM, EDS and EBSD reconstruction

Hitachi S-4300

  • Located at the University of Kentucky
  • Dual-Mode objective lens
  • Analytical capabilities for biological and materials science.

Hitachi S-4300 Features

  • Filament Type: Cold-cathode field emission
  • Detectors: SE/BSE/EBSD
  • Image Resolution: Secondary Electron = 1.5 nm
  • Specimen Stage: Motion range = 50 x 100 mm
  • Tilt angle = – 5° to + 60 °
  • Rotation = 360° (continuous)
  • Max Specimen Size: 19×102 mm (height x dia)
  • Oxford HKL Electron Backscatter Diffraction (EBSD) system for crystal texture analysis and orientation image

Ideal for: high resolution imaging, crystal orientation, Z-contrast imaging



FEI Quanta 250 Features

  • Located at the University of Kentucky
  • Dual-Mode objective lens
  • Analytical capabilities for biological and materials science.

FEI Quanta 250 Features

  • Filament Type: field emission
  • Detectors: SE/BSE/EDX/STEM/E-SEM
  • Image Resolution: Secondary Electron = 1.0 nm
  • Specimen Stage: X-Y 50 mm
  • Tilt angle = – 15° to + 75 °
  • Rotation = 360° (continuous)
  • Max Specimen Size: 19×102 mm (height x dia)
  • Low vacuum capability for environmental SEM
  • Peltier cooling stage for low temperatures work / heating stage up to 800°C
  • Solution injection needle

Ideal for: high resolution imaging, EDX, biological samples, temperature variation

Zeiss EVO MA 10

  • Located at the University of Kentucky
  • Dual-Mode objective lens

Zeiss EVO MA 10 Features

  • Filament Type: Tungsten
  • Detectors: SE/VPSE (environmental)/BSE/EDX
  • Image Resolution: Secondary Electron = 1.9 nm
  • Specimen Stage: 5-axis motorized stage          80 x 100 x 35mm (translation XYZ)
  • Tilt angle = – 10 ° to + 90 °
  • Rotation = 360 ° (continuous)
  • Specimen Size: 100 mm x 200 mm (Height x Diameter), max weight 500g

Ideal for: elemental analysis and mapping, biological samples, large samples, fracture analysis, Z-contrast imaging

Sample preparation at the University of Kentucky

The EMC provides access to many sample preparation equipment, from precision saw to ion polishing.

  • Buehler Isomet: low speed precision saw
  • Buehler Ecomet 3: mechanical polishing
  • Allied High Tech Multiprep: mechanical automated polishing and thinning for advanced sample preparation
  • Buehler Vibromet 2: vibration polishing for final preparation of EBSD samples
  • Buehler Minimet 1000: precision mechanical polishing/grinding of small specimens
  • Gatan Ultrasonic Disc Cutter (Model 601): disk cutting for TEM sample preparation
  • Gatan Dimpler/Grinder (Model 656): grinding/dimpling of TEM samples



  Western Kentucky University

 

JEOL 1400Plus TEM

  • Located at Western Kentucky University Ogden College Electron Microscopy Center
  • The facility is designed to handle groups of 10-15 students for demonstrations at each microscope, or sample preparation, including ultramicrotome use.
  • Equipped with IXRF-EDS detectors for elemental analysis
  • View samples either as analog images on a phosphor screen or contrast-enhanced digital images using an AMT CCD camera
  • Images can be captured either on film (ultimately scanned to 1.3 Gpixels) or on computer (8 Mpixels)

JEOL 5410LV SEM

  • Located at Western Kentucky University Ogden College Electron Microscopy Center
  • Dual-Mode objective lens
  • The facility is designed to handle groups of 10-15 students for demonstrations at each microscope, or sample preparation, including ultramicrotome use.
  • Equipped with IXRF-EDS detectors for elemental analysis
  • Useful for imaging surface structures
  • Can also be used for imaging three-dimensional structures embedded in plastic either by viewing serial sections mounted on a conductive substrate or by imaging the sample at the surface of the block face after each cut