Equipment
- Dual-Mode objective lens
Imaging
- 120 kV compact-digital Biological transmission electron microscope.
- User-friendly electron microscope that can be used in a lighted room.
- Fully digital, so samples can be scanned simply be viewing a computer screen. This is particularly important for viewing low contrast samples, and is convenient for training students.
- Associated software allows user to track the regions of tissue that have been viewed
- Includes an automated multi-frame function, which facilitates efficient and precise data collection.
- Ultramicrotome for ultrathin sectioning of samples for EM.
Leica Ultramicrotome Features
- Adjustable cutting window (0.3-15mm) and cutting speed (0.2-90mm/s wheel controlled)
- 360° rotatable knife block
- Knife holder for 6-12mm knives
- Top/back light LED Illumination
- Magnification: S4E: 10X-48X
Cutting Transmission: vibration decoupled gravity stroke
Coarse knife-movements: N-S: 10mm stepping motor
E-W: 25mm manual drive
Imaging
- 2 nm ultra-high resolution
- Back-scattered detector (BSD)
- Scanning Transmission Electron Microscopy (STEM) Detector
- Energy-dispersive X-ray spectroscopy (EDS) Detector
- Dual-Mode objective lens
Features
- Field Emission Gun operating at 200 keV
- Resolution: 0.19 nm point-to-point imaging
- Specimen Stage: +- 12 degree tilt
- JEOL single, double low background, and GATAN cryo double tilt holders available
- Fischione HAADF detector for Z-contrast STEM
- Oxford INCA EDX detector
- EmiSpec EsVision
- GATAN GIF 2000 EELS spectrometer
- Ideal for: Â EDS for elemental profiling and mapping, EELS for light element analysis and mapping, SAD for crystal phase structural analysis, high-angle annular dark field (HAADF) STEM for Z-contrast; useful for composite and catalyst research
- Dual-Mode objective lens
Imaging
- Field Emission Gun (Schottky emitter), with UC technology (monochromator)
- Sub-nanometer resolution from 500 V to 30 kV
- Beam deceleration capabilities (stage bias)
- Specimen Stage: x, y 150 mm; z 10mm all piezo driven; tilt -10 to +60°
- Six electron detectors for optimal imaging
Focused Ion Beam (FIB)
- Gallium LMIS (Liquid Metal Ion Source) for precision milling, cross-sectioning, TEM sample preparation
- Gas Injection System (GIS) for metal and insulator deposition
- Slice milling and imaging steps automated for 3D SEM reconstruction
Characterization
- Oxford EDX detector for elemental analysis
Oxford EBSD detector for crystal orientation analysis - 3D EDX and EBSD capabilties
Ideal for:Â Ultra high resolution imaging, in-situ cross-sectioning and TEM sample preparation, automated surface pattern generation (milling or deposition), 3D SEM, EDS and EBSD reconstruction
- Dual-Mode objective lens
- Analytical capabilities for biological and materials science.
Hitachi S-4300 Features
- Filament Type: Cold-cathode field emission
- Detectors: SE/BSE/EBSD
- Image Resolution: Secondary Electron = 1.5 nm
- Specimen Stage: Motion range = 50 x 100 mm
- Tilt angle = – 5° to + 60 °
- Rotation = 360° (continuous)
- Max Specimen Size: 19×102 mm (height x dia)
- Oxford HKL Electron Backscatter Diffraction (EBSD) system for crystal texture analysis and orientation image
Ideal for: high resolution imaging, crystal orientation, Z-contrast imaging
- Dual-Mode objective lens
- Analytical capabilities for biological and materials science.
FEI Quanta 250 Features
- Filament Type: field emission
- Detectors: SE/BSE/EDX/STEM/E-SEM
- Image Resolution: Secondary Electron = 1.0 nm
- Specimen Stage:Â X-Y 50 mm
- Tilt angle = – 15° to + 75 °
- Rotation = 360° (continuous)
- Max Specimen Size: 19×102 mm (height x dia)
- Low vacuum capability for environmental SEM
- Peltier cooling stage for low temperatures work / heating stage up to 800°C
- Solution injection needle
Ideal for: high resolution imaging, EDX, biological samples, temperature variation
- Dual-Mode objective lens
Zeiss EVO MA 10 Features
- Filament Type: Tungsten
- Detectors: SE/VPSE (environmental)/BSE/EDX
- Image Resolution: Secondary Electron = 1.9 nm
- Specimen Stage: 5-axis motorized stage          80 x 100 x 35mm (translation XYZ)
- Tilt angle = – 10 ° to + 90 °
- Rotation = 360 ° (continuous)
- Specimen Size: 100 mm x 200 mm (Height x Diameter), max weight 500g
Ideal for: elemental analysis and mapping, biological samples, large samples, fracture analysis, Z-contrast imaging
- Buehler Isomet: low speed precision saw
- Buehler Ecomet 3: mechanical polishing
- Allied High Tech Multiprep: mechanical automated polishing and thinning for advanced sample preparation
- Buehler Vibromet 2: vibration polishing for final preparation of EBSD samples
- Buehler Minimet 1000: precision mechanical polishing/grinding of small specimens
- Gatan Ultrasonic Disc Cutter (Model 601): disk cutting for TEM sample preparation
- Gatan Dimpler/Grinder (Model 656): grinding/dimpling of TEM samples
- The facility is designed to handle groups of 10-15 students for demonstrations at each microscope, or sample preparation, including ultramicrotome use.
- Equipped with IXRF-EDS detectors for elemental analysis
- View samples either as analog images on a phosphor screen or contrast-enhanced digital images using an AMT CCD camera
- Images can be captured either on film (ultimately scanned to 1.3 Gpixels) or on computer (8 Mpixels)
- Dual-Mode objective lens
- The facility is designed to handle groups of 10-15 students for demonstrations at each microscope, or sample preparation, including ultramicrotome use.
- Equipped with IXRF-EDS detectors for elemental analysis
- Useful for imaging surface structures
- Can also be used for imaging three-dimensional structures embedded in plastic either by viewing serial sections mounted on a conductive substrate or by imaging the sample at the surface of the block face after each cut