BEGIN:VCALENDAR
PRODID:-//AT Content Types//AT Event//EN
VERSION:1.0
BEGIN:VEVENT
DTSTART:20081117T200000Z
DTEND:20081117T210000Z
DCREATED:20081111T183634Z
UID:ATEvent-4766df7388ca64e7e47f0b0d4e3020bd
SEQUENCE:0
LAST-MODIFIED:20081111T183651Z
SUMMARY:ECE Seminar
DESCRIPTION:Mon\, Nov. 17\, 2008\; 3-4pm\; "Reliability of Nanoscale C
 MOS Devices with High-k Gate Dielectrics"
LOCATION:Lutz Hall Room 306
PRIORITY:3
TRANSP:0
END:VEVENT
END:VCALENDAR