BEGIN:VCALENDAR
PRODID:-//AT Content Types//AT Event//EN
VERSION:2.0
METHOD:PUBLISH
BEGIN:VEVENT
DTSTAMP:20120531T204425Z
CREATED:20081111T183634Z
UID:ATEvent-4766df7388ca64e7e47f0b0d4e3020bd
LAST-MODIFIED:20081111T183651Z
SUMMARY:ECE Seminar
DTSTART:20081117T200000Z
DTEND:20081117T210000Z
DESCRIPTION:Mon\, Nov. 17\, 2008\; 3-4pm\; "Reliability of Nanoscale C
 MOS Devices with High-k Gate Dielectrics"
LOCATION:Lutz Hall Room 306
CONTACT:Rodica McCoy\, 852-6348\, rbmcco01@louisville.edu
CLASS:PUBLIC
END:VEVENT
END:VCALENDAR