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You are here: Home → For Faculty & Staff → Reference Search → 2006 References → Runge et al, 2006, Combination of Polarized TIRF and ATR Spectroscopies for Determination of the Second and Fourth Order Parameters of Molecular Orientation in Thin Films and Construction of an Orientation Distribution based on the Maximum Entropy Method

Runge et al, 2006, Combination of Polarized TIRF and ATR Spectroscopies for Determination of the Second and Fourth Order Parameters of Molecular Orientation in Thin Films and Construction of an Orientation Distribution based on the Maximum Entropy Method

Reference

Runge, A. F., Saavedra, S. S., & Mendes, S. B.  Combination of Polarized TIRF and ATR Spectroscopies for Determination of the Second and Fourth Order Parameters of Molecular Orientation in Thin Films and Construction of an Orientation Distribution based on the Maximum Entropy Method. Journal of Physical Chemistry B, 110(13): 6721-6731. (2006).
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