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You are here: Home → For Faculty & Staff → Reference Search → 2005 References → Chen et al, 2005, A Rietveld refinement using neutron powder diffraction data of a fully deuterated topaz, A12(SiO4)(OD)2.

Chen et al, 2005, A Rietveld refinement using neutron powder diffraction data of a fully deuterated topaz, A12(SiO4)(OD)2.

Reference

Chen, J., Lager, G. A., Kunz, M., Hansen, T. C., & Ulmer, P.  A Rietveld refinement using neutron powder diffraction data of a fully deuterated topaz, A12(SiO4)(OD)2.. Acta Crystallographica, E61: i253-i255. (Professional Student Author(s): Chen,J.) (2005).
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