Short Course 1

Electron Microscopy, Surface Analysis and Photoelectrochemical Techniques

3:30 – 4:30 pm: Analytical Electron Microscopy in Nanomaterials Characterization

(Z.Q. Chen, UofL)

·         Introduction to Electron Microscopy

§         Brief history of electron microscopy

§         Interaction between electron and specimen

§         Overview of electron microscope

·         Overview of TEM specimen preparation

·         Analytical electron microscopy and its related techniques

§         High resolution electron microscopy

§         Scanning transmission electron microscopy

§         EDX in TEM/STEM

§         Electron energy loss spectroscopy (EELS)

·         Three dimensional electron microscopy

§         Single particle analysis

§         Electron crystallography

§         Tomography

·         Applications of AEM in Nanomaterials

4:30– 5:15 pm: Surface Analysis Characterization: Concepts and Case Studies

(G.U. Sumanasekera, UofL)

·         Scanning Tunneling Microscopy (STM)

·         Scanning Tunneling Spectroscopy (STS)

·         X-Ray Photoelectron Spectroscopy (XPS)

·         Photoemission Spectroscopy/ESCA (Electron Spectroscopy for Chemical Analysis)

·         Auger Electron Spectroscopy (AES)

·         Ultraviolet Photoelectron Spectroscopy (UPS) and Kelvin Probe

·         Raman Spectroscopy

5:15– 5:30 pm: Semiconductor Electrode Characterization (V. Chakrapani, UofL)

o        Vacuum and Electrochemical Energy Scales

o        Nature of electrode reactions and electrochemical double layers

o        Mott-Schottky Analysis and determination of flat band potential

o        Photoeffects at the semiconductor/liquid interface